August 31 - September 4, 2010, Buenos Aires Sheraton Hotel, Buenos Aires, Argentina

EMBC'10 Paper Abstract


Paper FrE02.3

Kantartzis, Panagiotis (City University London), KUNOTH, ANGELA (UNIVERSITAET PADERBORN), PABEL, ROLAND (UNIVERSITY OF PADERBORN), Liatsis, Panos (City University)

Towards non-invasive EIT imaging of domains with deformable boundaries

Scheduled for presentation during the Oral Session "Electrical Impedance Imaging Techniques II" (FrE02), Friday, September 3, 2010, 18:00−18:15, Libertado B

32nd Annual International IEEE EMBS Conference, August 31 - September 4, 2010, Buenos Aires Sheraton Hotel, Buenos Aires, Argentina

This information is tentative and subject to change. Compiled on March 6, 2021

Keywords Electrical Impedance Imaging Techniques, Electrical Source Imaging Techniques, Image Reconstruction and Retrieval - Fast Algorithms


We investigate on the use of the Domain Embedding Method (DEM) for the forward modeling in EIT. This approach is suitably configured to overcome the model meshing bottleneck since it does not require that the mesh on the domain is adapted to the boundary surface. This is of crucial importance for, e.g., clinical applications of EIT, as it avoids tedious and time-consuming mbox{(re-)meshing} procedures. The suggested DEM approach can accommodate arbitrary yet Lipschitz smooth boundary surfaces and is not limited to polygonal domains. For the discretisation purposes, we employ B-splines as they allow for arbitrary accuracy by raising the polynomial degree and are easy to implement due to their inherent piecewise polynomial structure. Numerical experiments confirm that a B-spline discretization yields, similarly to conventional Finite Difference discretizations, increasing condition numbers of the system matrix with respect to the discretisation levels. Fortunately, multiresolution ideas based on B-splines allow for optimal wavelet preconditioning.



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